Hiden Analytical Introduce the ToF-qSIMS Workstation

The Hiden ToF-qSIMS Workstation uniquely combines both time-of-flight and quadrupole analysers in a single SIMS instrument. The surface is where materials interact with the environment, where adhesion, deposition, corrosion and contamination occur and the ToF-qSIMS is the tool to characterise and solve problems in this region. The ToF analyser possesses high mass range and high mass resolution allowing the static SIMS mode to identify species on the exposed surface of a material, especially organics. It can detect surface contamination as thin as one atom; contamination which may later impact the product operation, such as failure of an adhesive bond or peeling of a coating. In one scan the ToF-qSIMS produces an image of all the elements and molecules from a surface (a full mass spectrum for each pixel) allowing a scientist to investigate the chemical distribution, either in real time or potentially years after acquisition.

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