New SIMS Applications Catalogue

Hiden Analytical introduce the SIMS applications catalogue. Originally developed for semiconductor applications, SIMS depth profiling provides ppm sensitivity and nanometre depth resolution; characterising the composition as a function of depth. This powerful technique is now applied in fields as diverse as metallic and optical coatings, corrosion and adhesion analysis, metallurgy and biomedical applications and energy materials research. The use of mass spectrometry uniquely allows SIMS to be used for stable isotope diffusion studies and nuclear engineering.

For more information on New SIMS Applications Catalogue talk to Hiden Analytical Ltd