Aaronia EMV-Bundle 1 (near-field)

Our EMC kit allows for straightforward pinpointing and measurement of interference sources in electronic component groups as well as execution and monitoring of generic EMC measurement.It is perfect for locating interference sources which might have been found e.g. in an EN55011, EN55022 or EN50371 (Class A or Class B) survey.

For more information on Aaronia EMV-Bundle 1 (near-field) talk to The Debug Store