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FIB-SIMS Nano-scale Material Analysis
Product Code: 29
![FIB-SIMS Nano-scale Material Analysis](https://images.findtheneedle.co.uk/findtheneedle/products/16176832.jpg)
Hiden Analytical offers high-performance bolt-on secondary ion mass spectrometry (SIMS) for existing focused ion beam (FIB) systems, providing outstanding surface specificity and a naturally high dynamic range for advanced nanoscale material analysis. Our FIB-SIMS systems are poised to enhance your operations, from routine detection tasks to complex sample preparation.
For more information on FIB-SIMS Nano-scale Material Analysis talk to Hiden Analytical Ltd
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