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Secondary Ion Mass Spectrometer Differentially Pumped Manufacturer
Product Code: 98
The IMP-EPD is a differentially pumped, ruggedised secondary ion mass spectrometer for the analysis of secondary ions from the ion beam etch process. The system includes integrated software with process specific algorithms developed for optimum process control.
For more information on Secondary Ion Mass Spectrometer Differentially Pumped Manufacturer talk to Hiden Analytical Ltd
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