IFG200 Fast Atom Bombardment Ion Gun

State of the art FAB / ion gun for surface and depth analysis applications •Static and Dynamic SIMS Studies•Auger Electron Spectroscopy•Ion Beam Sputtering•FAB/SIMS studies of insulators•Surface Science Studies•Rastering / Depth Profiling The Hiden IFG200 Fast Atom Bombardment / Ion Gun for static and dynamic SIMS, featuring: •2mm atom or ion beam at energies from 0.5 – 5 keV.•Charge exchange chamber for ion ® fast atom conversion for FAB studies.•Electrostatic deflection lens for clean FAB beam.•High current density and stable positioning.•3° offset in the ion gun column for optimum rejection of neutrals in ion beam mode.•Inert gas and Oxygen capability.•Differentially pumped source region.•Easily replaceable twin filament assembly.•Control unit fully compatible with IG20 high-brightness ion gun.•Integrated operation with SIM and EQS probes for direct raster rate / area control.

For more information on IFG200 Fast Atom Bombardment Ion Gun talk to Hiden Analytical Ltd