Time of Flight Analyser Quadrupole Mass Spectrometry

The Hiden TOF-qSIMS system is designed for surface analysis and depth profiling applications of a wide range of materials including polymers, pharmaceuticals, superconductors, semiconductors, alloys, optical and functional coatings and dielectrics, with measurement of trace components to sub-ppm levels.

For more information on Time of Flight Analyser Quadrupole Mass Spectrometry talk to Hiden Analytical Ltd