Optoelectronic Systems

SemiProbe has pioneered new methods and capabilities for testing optoelectronic components at wafer level and has extensive experience testing light emitting diodes (LED), vertical cavity surface emitting lasers (VCSEL) and photo diodes. Our unique integrating sphere holder enables users to utilize the same PS4L system for horizontal (EELD) and vertical (VCSEL, LED) testing in either a manual or semiautomatic configuration. We have created wafer maps capable of mapping >100k die, unique chuck systems to handle fragile or broken wafers, high speed stages and software to increase throughput.

For more information on Optoelectronic Systems talk to Inseto (UK) Ltd