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SXUV family: Silicon photodiodes for EUV & UV (0.1-400nm)
Opto Diodes UVG series diodes have 100% internal quantum efficiency. These devices are optimised for photon detection from 130-1100nm with a 40-150nm oxide window.
SXUV series devices use a metal silicide window to address the issue of surface recombination in oxide windows (resulting in loss of 100% internal QE) after receiving several G-rad (SiO2) dose. SXUV series devices have nearly infinite radiation hardness to photons and are recommended for the detection of UV/EUV pulse radiation; high photon flux; and when pulse energy density is higher than 0.1 J/cm.
ODC have released a duo lateral position sensitive version of the SXUV family. This 5.0mm x 5.0mm active area detector provides sub-micron position resolution in combination with stable response during long-term exposure to EUV & UV.

For more information on SXUV family: Silicon photodiodes for EUV & UV (0.1-400nm) talk to Prin & Lea

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